Wafer test technology
We propose improvements to tester capabilities in line with production quantities.
We propose test development and production capacity improvement tailored to customer specifications. We build testing methods, develop test programs, and create test boards/probe cards according to product specifications and test specifications. In the "OST (Outliers Screening Test)," we detect outlier chips from wafer test results to further improve the quality of good chips as part of quality control for automotive products. For individual test item measurement values, we calculate distributions and classify chips with data that falls outside the main distribution as defective through "PAT," and we detect chips that fall outside the good product distribution based on the positional distribution on the wafer using test result map data, classifying them as defective in the "GAT" test. *For more details, please refer to the PDF document or feel free to contact us.
- Company：菱進テック
- Price：Other
